Daniel Peykov
Experience
Software Engineer
Mountain View, CA
Jul 2018 — present
I google stuff professionally, especially Android stuff.
Software Engineer
Palo Alto, CA
Oct 2016 — Jul 2018
I built a dozen systems used to improve productivity and manage software releases.
Technology Associate
New York, NY  |  Montreal, QC
Feb 2015 — Jul 2016
I worked on an application which generated personalized financial reports.
Education
Master of Science
Cambridge, MA
2014
I studied the physics of photonic crystals to make efficient solar panels.
Bachelor of Engineering
Montreal, QC
2012
I was a CS teaching assistant, and I researched ways of measuring nano-properties.
Publications
  1. The effects of surface diffusion on high temperature selective emitters, D. Peykov, Y.X. Yeng, I. Celanovic, J.D. Joannopoulos, and C.A. Schuh, Optics Express 23 (2015) 9979-9993.
  2. Thick sputtered tantalum coatings for high-temperature energy conversion applications, V. Stelmakh, D. Peykov, W.R. Chan, J.J. Senkevich, J.D. Joannopoulos, M. Soljacic, I. Celanovic, R. Castillo, K. Coulter, and R. Wei, Journal of Vacuum Science & Technology A 33 (2015) 061204.
  3. Investigation of an iterative matrix method for the inversion of ARXPS data, R.W. Paynter and D. Peykov, Surface and Interface Analysis 48 (2015) 54-63.
  4. On the choice of tuning parameters in the inversion of ARXPS data, D. Peykov and R.W. Paynter, Journal of Electron Spectroscopy and Related Phenomena 197 (2014) 93-101.
  5. Comparison of parameter choice methods for the analytical inversion of ARXPS data, D. Peykov and R.W. Paynter, Journal of Electron Spectroscopy and Related Phenomena 193 (2014) 63-78.
  6. Variations in nanomechanical properties of back-end Zr-2.5Nb pressure tube material, M. Gallaugher, D. Peykov, N. Bordusch, R.R. Chromik, R. Gauvin, L. Rodrigue, and M.L. Trudeau, Journal of Nuclear Materials 442 (2013) 116-123.
  7. Evaluation of strain rate sensitivity by constant load nanoindentation, D. Peykov, E. Martin, R.R. Chromik, R. Gauvin, and M.L. Trudeau, Journal of Materials Science 47 (2012) 7189-7200.
  8. Matrix-based approach for the inversion of ARXPS data, D. Peykov and R.W. Paynter, Journal of Electron Spectroscopy and Related Phenomena 185 (2012) 103-111.